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  2. Oncologic Imaging: Bone Tumors

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  3. Modeling of Electrical Overstress in Integrated Circuits

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  4. Hot-Carrier Reliability of MOS VLSI Circuits

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  6. Design Automation for Timing-Driven Layout Synthesis

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    Moore's law [Noy77], which predicted that the n...

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  7. Physical Design for Multichip Modules

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  8. Oncologic Imaging: Bone Tumors

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  9. Modeling of Electrical Overstress in Integrated Circuits

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    Electrical overstress (EOS) and Electrostatic d...

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  10. Hot-Carrier Reliability of MOS VLSI Circuits

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  11. Electrothermal Analysis of VLSI Systems

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  12. Design Automation for Timing-Driven Layout Synthesis

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    Moore's law [Noy77], which predicted that the n...

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