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Progress in Nanoscale Characterization and Manipulation
ISBN-13:
9789811304545
Veröffentl:
2018
Seiten:
508
Autor:
Rongming Wang
Serie:
272, Springer Tracts in Modern Physics
eBook Typ:
PDF
eBook Format:
EPUB
Kopierschutz:
1 - PDF Watermark
Sprache:
Englisch
Beschreibung:
This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research.
Electron/Ion Optics.- Scanning Electron Microscopy.- Transmission Electron Microscopy.- Scanning Transmission Electron Microscopy (STEM).- Spectroscopy.- Aberration Corrected Transmission Electron Microscopy and Its Applications.- In situ TEM: Theory and Applications.- Helium Ion Microscopy.
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