Physical Principles of Electron Microscopy
An Introduction to TEM, SEM, and AEM
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ISBN-13:
9783319398761
Veröffentl:
2016
Einband:
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Erscheinungsdatum:
07.07.2016
Seiten:
208
Autor:
R. F. Egerton
Gewicht:
483 g
Format:
241x160x17 mm
Sprache:
Englisch
Beschreibung:
This popular textbook provides an introduction to the theory and practice of electron microscopy. The second edition has been updated to reflect the recent developments, including correction of lens aberrations in a TEM column and new material on environmental TEM and SEM. The text is linked to a new website that contains additional educational material such as sample exam questions and answers to selected problems. This edition also contains expanded reference lists that allow the reader to efficiently explore key topics in greater depth.
An Introduction to Microscopy.- Electron Optics.- The Transmission Electron Microscope.- TEM Specimens and Images.- The Scanning Electron Microscope.- Analytical Electron Microscopy.- Special Topics.- Appendix: Mathematical Derivations.
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