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Debug Automation from Pre-Silicon to Post-Silicon
ISBN-13:
9783319093093
Veröffentl:
2014
Seiten:
171
Autor:
Mehdi Dehbashi
eBook Typ:
PDF
eBook Format:
EPUB
Kopierschutz:
1 - PDF Watermark
Sprache:
Englisch
Beschreibung:
This book describes automated debugging approaches for the bugs and the faults which appear in different abstraction levels of a hardware system. The authors employ a transaction-based debug approach to systems at the transaction-level, asserting the correct relation of transactions. The automated debug approach for design bugs finds the potential fault candidates at RTL and gate-level of a circuit. Debug techniques for logic bugs and synchronization bugs are demonstrated, enabling readers to localize the most difficult bugs. Debug automation for electrical faults (delay faults)finds the potentially failing speedpaths in a circuit at gate-level. The various debug approaches described achieve high diagnosis accuracy and reduce the debugging time, shortening the IC development cycle and increasing the productivity of designers.
Introduction.- Preliminaries.- Part I Debug of Design Bugs.- Automated Debugging for Logic Bugs.- Automated Debugging from Pre-Silicon to Post-Silicon.- Automated Debugging for Synchronization Bugs.- Part II Debug of Delay Faults.- Analyzing Timing Variations.- Automated Debugging for Timing Variations.- Efficient Automated Speedpath Debugging.- Part III Debug of Transactions.- Online Debug for NoC-Based Multiprocessor SoCs.- Summary and Outlook.
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