Scanning Transmission Electron Microscopy of Nanomaterials
Basics of Imaging and Analysis
HC gerader Rücken kaschiert
Print on Demand | Lieferzeit: Print on Demand - Lieferbar innerhalb von 3-5 Werktagen I
ISBN-13:
9781848167896
Veröffentl:
2014
Einband:
HC gerader Rücken kaschiert
Erscheinungsdatum:
21.08.2014
Seiten:
616
Autor:
Nobuo Tanaka
Gewicht:
1032 g
Format:
235x157x37 mm
Sprache:
Englisch
Beschreibung:
The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials.
Introduction; Historical Survey of Development of STEM; Basic Knowledge; Theories for ADF-STEM Image Simulation; Application of ADF-STEM Imaging to Nanomaterials Science; Fitting between STEM Images and the First Principles Structure Calculation; STEM/EELS Elemental Mapping; Three-Dimensional Tomographic Imaging by STEM; Scanning Confocal EM (SCEM); STEM Holography and Lorentz STEM; Future Prospects.
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