Pattern recognition presents one of the most significant challenges for scientists and engineers, and many different approaches have been proposed. The aim of this book is to provide a self-contained account of probabilistic analysis of these approaches. The book includes a discussion of distance measures, nonparametric methods based on kernels or nearest neighbors, Vapnik-Chervonenkis theory, epsilon entropy, parametric classification, error estimation, free classifiers, and neural networks. Wherever possible, distribution-free properties and inequalities are derived. A substantial portion of the results or the analysis is new. Over 430 problems and exercises complement the material.

Pattern recognition presents a significant challege for scientists and engineers, and many different approaches have been proposed. This book provides a self-contained account of probabilistic techniques that have been applied to the subject. Researchers and graduate students will benefit from this wide-ranging account of the field.

Preface * Introduction * The Bayes Error * Inequalities and alternatedistance measures * Linear discrimination * Nearest neighbor rules *Consistency * Slow rates of convergence Error estimation * The regularhistogram rule * Kernel rules Consistency of the k-nearest neighborrule * Vapnik-Chervonenkis theory * Combinatorial aspects of Vapnik-Chervonenkis theory * Lower bounds for empirical classifier selection* The maximum likelihood principle * Parametric classification *Generalized linear discrimination * Complexity regularization *Condensed and edited nearest neighbor rules * Tree classifiers * Data-dependent partitioning * Splitting the data * The resubstitutionestimate * Deleted estimates of the error probability * Automatickernel rules * Automatic nearest neighbor rules * Hypercubes anddiscrete spaces * Epsilon entropy and totally bounded sets * Uniformlaws of large numbers * Neural networks * Other error estimates *Feature extraction * Appendix * Notation * References * Index