Expert practical and theoretical coverage of runs and scansThis volume presents both theoretical and applied aspects of runsand scans, and illustrates their important role in reliabilityanalysis through various applications from science and engineering.Runs and Scans with Applications presents new and exciting contentin a systematic and cohesive way in a single comprehensive volume,complete with relevant approximations and explanations of somelimit theorems.The authors provide detailed discussions of both classical andcurrent problems, such as:* Sooner and later waiting time* Consecutive systems* Start-up demonstration testing in life-testing experiments* Learning and memory models* "Match" in genetic codesRuns and Scans with Applications offers broad coverage of thesubject in the context of reliability and life-testing settings andserves as an authoritative reference for students and professionalsalike.