Digital Noise Monitoring of Defect Origin
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ISBN-13:
9780387717531
Veröffentl:
2007
Erscheinungsdatum:
25.07.2007
Seiten:
224
Autor:
Telman Aliev
Gewicht:
481 g
Format:
245x165x22 mm
Sprache:
Englisch
Beschreibung:
Digital Noise Monitoring of Defect Origin is for both academics and professionals in the fields of engineering, biological sciences, physical science, and automation with particular emphasis on power engineering, oil-and-gas extraction, and aviation among others. The focus of the book is on determining defect origins. The author divides the process into the stages of monitoring the defect origin, identification of the defect and its stages, and control of the defect. The significance of this work is also connected to the possibility of using the noise as a data carrier for creating technologies that detect the initial stage of changes in objects.
Includes several technologies that cover the initial stage of the origin of the defect
Difficulties of Monitoring a Defect at Its Origin and Its Dataware Features.- Position-Binary Technology of Monitoring Defect at its Origin.- Technology of Digital Analysis of Noise as a Carrier of Information about the Beginning of a Defect's Origin.- Robust Correlation Monitoring of a Defect at its Origin.- Spectral Monitoring of a Defect's Origin.- The Digital Technology of Forecasting Failures by Considering Noise as a Data Carrier.- The Technology of Monitoring a Defect's Origin by Considering Noise as a Data Carrier.
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