Practical Fourier Transform Infrared Spectroscopy: Industrial and Laboratory Chemical Analysis presents the Fourier Transform Infrared Spectroscopy (FT-IR) as a valuable analytic tool in solving industrial and laboratory chemical problems.The text provides chapters that deal with the various applications of FT-IR such as the characterization of organic and inorganic superconductors; the study of forensic materials such as controlled drug particles, fragments of polymers, textile fibers, and explosives; identification and quantification of impurities and measurement of epitaxial thickness in silicon; bulk and surface studies and microanalyses of industrial materials; and the identification or determination of unknown compounds.Chemists, industrial researchers, and product engineers will find the book useful.

ContributorsPrefaceAcknowledgments1. The Use of Vibrational Spectroscopy in the Characterization of High-Critical-Temperature Ceramic Superconductors I. Structural Considerations and Group Theory II. Methods for Infrared and Raman Measurements III. Vibrational Spectroscopy of La2_xMxCuO4 IV. Vibrational Spectroscopy of ABa2Cu3O7_x V. Concluding Remarks References2. The Use of Vibrational Spectroscopy in the Characterization of Synthetic Organic Electrical Conductors and Superconductors I. Organic Charge-Transfer Conductors and Superconductors II. Polymer-Salt Complexes III. Transition Element-Macrocyclic Ligand Complexes IV. Organic Polymers: Polyacetylene V. FT-IR Microspectroscopy of Synthetic Electrical Conductors References3. FT-IR Microsampling Techniques I. Introduction II. Experimental Considerations III. Applications IV. Conclusion References4. Possibilities and Limitations of FT-Raman Spectroscopy I. Introduction II. Principles III. Instrumentation IV. Applications and Limitations V. Prospects References5. Vibrational Circular Dichroism: Comparison of Techniques and Practical Considerations I. Introduction II. Experimental Design III. Current Experimental Capabilities IV. Example Application: VCD of Polypeptides and Proteins References6. Characterization of Semiconductor Silicon Using Fourier Transform Infrared Spectroscopy I. Introduction II. Characterization of Interstitial Oxygen and Substitutional Carbon in Silicon III. Nitrogen in Silicon IV. Hydrogen in Silicon V. Shallow Impurities in Silicon VI. Radiation Damage VII. Epitaxial Thickness Measurements VIII. Quantitative Measurements on Passivation Layers IX. Conclusion References7. Industrial Applications of FT-IR I. Introduction II. Microanalysis by FT-IR Microscopy III. Surface Analysis IV. Bulk Analysis V. Summary References8. Multivariate Calibration Methods Applied to Quantitative FT-IR Analyses I. Introduction II. Experimental Aspects of Quantitative FT-IR Analyses III. Univariate versus Multivariate Calibration IV. Classical Least-Squares Calibration V. q-Matrix Method VI. Inverse Least-Squares Method VII. Factor Analysis Methods VIII. Cross-Correlation and Kalman Filter Methods IX. Variations in Multivariate Calibration Methods X. Error Analysis, Diagnostics, and Outlier Detection XI. Applications XII. Summary References9. Industrial Applications of GC/FT-IR I. Introduction II. Development of GC/IR III. Outline of Apparatus IV. Basic Features of GC/FT-IR Spectra V. Applications VI. Conclusion ReferencesIndex